100 Programmable Logic Devices (PLD) 169

XC2C128-7VQ100I by Xilinx is a 128 macrocell FLASH PLD with 80 I/O lines, operating at up to 119 MHz. It features a propagation delay of 7.5 ns and can handle a max supply voltage of 1.9 V. Ideal for industrial applications requiring in-system programmability and JTAG boundary scan testing capabilities.

XC2C256-7VQ100C by Xilinx is a 256 macrocell FLASH PLD with 80 I/O lines, operating at up to 108 MHz. It features a propagation delay of 7.5 ns and can be in-system programmable. Ideal for applications requiring fast processing speeds and versatile I/O capabilities in commercial-grade environments.

LC4064V-5TN100C by Lattice Semiconductor is a 64 macrocell EE PLD with 74 inputs and 64 outputs. It has a propagation delay of 5 ns, operates at max clock frequency of 156 MHz, and supports JTAG boundary scan test. Ideal for applications requiring fast processing speeds and high I/O capabilities in compact designs.

LC4064V-5TN100I by Lattice Semiconductor is a 3.3V EE PLD with 64 macro cells, 74 inputs, and 64 outputs. With a propagation delay of 5ns and max clock frequency of 156MHz, it's ideal for applications requiring fast processing speeds like industrial automation and telecommunications systems.

LC4064V-75TN100E by Lattice Semiconductor is a 3.3V EE PLD with 64 macro cells and 74 inputs. With a propagation delay of 7.5 ns, it operates at up to 111 MHz clock frequency. Ideal for applications requiring in-system programmability and JTAG boundary scan testing in a compact square package with gull wing terminals.

LC4064ZC-5TN100C by Lattice Semiconductor is a 64 macrocell EE PLD with 74 inputs and 64 I/O. It has a propagation delay of 5 ns, operates at max clock frequency of 156 MHz, and supports JTAG boundary scan test. Ideal for applications requiring fast processing speeds in programmable logic devices.

LC4064ZC-75TN100C by Lattice Semiconductor is a 1.8V EE PLD with 64 macro cells, 74 inputs, and 64 outputs. It features a propagation delay of 7.5ns, operates at temperatures from 0 to 90°C, and has JTAG boundary scan test capability. Ideal for applications requiring programmable logic devices in compact form factors with high clock frequencies up to 111MHz.

LC4128V-27TN100C by Lattice Semiconductor is a 3.3V EE PLD with 128 macro cells, 74 inputs, and 64 I/O lines. With a propagation delay of 2.7 ns and max clock frequency of 222 MHz, it's ideal for applications requiring fast processing speeds in programmable logic devices. The device is surface mountable and features JTAG boundary scan test capability for efficient testing processes.

LC4128V-5TN100C by Lattice Semiconductor is a 3.3V EE PLD with 128 macro cells, 74 inputs, and 64 I/Os. With a propagation delay of 5ns and max clock frequency of 156MHz, it's ideal for applications requiring fast processing speeds in programmable logic devices. The device is surface mountable and features JTAG boundary scan test capability for efficient testing processes.

LC4128V-75TN100E by Lattice Semiconductor is a 3.3V EE PLD with 128 macro cells, 74 inputs, and 64 I/O lines. It has a propagation delay of 7.5ns, operates at up to 111MHz clock frequency, and supports JTAG boundary scan testing. Ideal for applications requiring fast processing speeds and high input/output capabilities in compact electronic designs.

LC4128V-75TN100I by Lattice Semiconductor is a 3.3V EE PLD with 128 macro cells, 74 inputs, and 64 I/O lines. With a propagation delay of 7.5ns and max clock frequency of 111MHz, it's ideal for applications requiring fast processing speeds in programmable logic devices. The device is surface mountable and features JTAG boundary scan test capability for efficient testing processes.

LC4128ZC-75TN100C by Lattice Semiconductor is a 128 macrocell EE PLD with 7.5 ns propagation delay, 74 inputs, and 64 I/O lines. It features in-system programmability, JTAG boundary scan test support, and operates at a max clock frequency of 111 MHz. Ideal for applications requiring fast processing speeds and high I/O capabilities in compact designs.

LC4128ZC-75TN100E by Lattice Semiconductor is a 128 macrocell EE PLD with 7.5 ns propagation delay, 74 inputs, and 64 I/O lines. Ideal for applications requiring in-system programmability, it features a max clock frequency of 111 MHz and operates b/w -40 to 130 °C.

LC4128ZC-75TN100I by Lattice Semiconductor is a 128 macrocell EE PLD with 7.5 ns propagation delay, 74 inputs, and 64 I/O organization. Ideal for industrial applications, it features in-system programmability, JTAG boundary scan test support, and operates at temperatures ranging from -40 to 105°C.

LC4256C-5TN100C by Lattice Semiconductor is a 256 macrocell EE PLD with 74 inputs and 64 I/O. Featuring a propagation delay of 5 ns, it operates at a max clock frequency of 156 MHz. Ideal for applications requiring in-system programmability, such as digital signal processing and telecommunications systems.

LC4256V-10TN100I by Lattice Semiconductor is a 3.3V EE PLD with 256 macro cells, 74 inputs, and 64 I/O lines. With a propagation delay of 10ns and max clock frequency of 86MHz, it's ideal for applications requiring fast processing speeds in programmable logic devices. The device is surface mountable and features JTAG boundary scan test capability for efficient testing processes.

LC4256V-3TN100C by Lattice Semiconductor is a 256 macrocell EE PLD with 74 inputs and 64 I/O lines. It has a propagation delay of 3 ns, operates at a max frequency of 212 MHz, and supports JTAG boundary scan testing. Ideal for applications requiring fast processing speeds and high I/O capabilities in compact designs.

LC4256V-5TN100I by Lattice Semiconductor is a 3.3V EE PLD with 256 macro cells, 74 inputs, and 64 I/O lines. With a propagation delay of 5ns and max clock frequency of 156MHz, it's ideal for applications requiring fast processing speeds in programmable logic devices. The device is surface mountable and features JTAG boundary scan test capability for efficient testing processes.

LC4256V-75TN100E by Lattice Semiconductor is a 256 macrocell EE PLD with 7.5 ns propagation delay, 74 inputs, and 64 I/O lines. It operates at a max clock frequency of 111 MHz and is in-system programmable for applications requiring high-speed processing and flexibility in automotive environments.

LC4256V-75TN100I by Lattice Semiconductor is a 3.3V EE PLD with 256 macro cells, 74 inputs, and 64 I/O lines. With a propagation delay of 7.5 ns and max clock frequency of 111 MHz, it's ideal for applications requiring fast processing speeds in programmable logic devices. Its compact square package shape and surface mount capability make it suitable for space-constrained designs where high performance is essential.

LC4256ZC-45TN100C by Lattice Semiconductor is a 256 macrocell EE PLD with 74 inputs and 64 I/O lines. Featuring a propagation delay of 4.5 ns, it operates at a max clock frequency of 150 MHz. Ideal for applications requiring in-system programmability and JTAG boundary scan testing in a compact square package with gull wing terminals.

LC4256ZC-75TN100C by Lattice Semiconductor is a 256 macrocell EE PLD with 74 inputs and 64 I/O lines. It has a propagation delay of 7.5 ns, operates at max clock frequency of 111 MHz, and can be in-system programmed. Ideal for applications requiring programmable logic devices with low profile flatpack package style.

LC4256ZC-75TN100E by Lattice Semiconductor is a 256 macrocell EE PLD with 7.5 ns propagation delay, 74 inputs, and 64 I/O lines. It features in-system programmability, JTAG boundary scan test support, and operates at a max clock frequency of 111 MHz. Ideal for applications requiring fast processing speeds and high I/O capabilities in compact designs.

LC4256ZC-75TN100I by Lattice Semiconductor is a 256 macrocell EE PLD with 7.5ns propagation delay, 74 inputs, and 64 I/O lines. Ideal for applications requiring in-system programmability, it features JTAG boundary scan test support and operates at up to 111MHz clock frequency.

Xilinx XCR3064XL-10VQG100C is a 64 macrocell EE PLD with 68 I/O lines, operating at max 95 MHz. It features in-system programmability, JTAG boundary scan test, and propagation delay of 10 ns. Ideal for applications requiring fast processing speeds and versatile I/O configurations in commercial-grade environments.

EE PLD; Grading Of Temperature: COMMERCIAL; Form Of Terminal: GULL WING; No. of Terminals: 100; Package Code: TFQFP; Package Shape: SQUARE;