{"id":2892,"date":"2024-07-15T11:35:01","date_gmt":"2024-07-15T11:35:01","guid":{"rendered":"https:\/\/partstack.com\/blog\/?p=2892"},"modified":"2024-07-15T11:35:01","modified_gmt":"2024-07-15T11:35:01","slug":"imfts-25nm-nand-flash-role-of-double-patterning-and-flash-memory","status":"publish","type":"post","link":"https:\/\/partstack.com\/blog\/imfts-25nm-nand-flash-role-of-double-patterning-and-flash-memory\/","title":{"rendered":"Breaking Down IMFT&#8217;s 25nm NAND Flash: The Role of Double Patterning and Flash Memory"},"content":{"rendered":"<p>In the evolving era of NAND flash <a href=\"https:\/\/partstack.com\/c\/other-function-semiconductors\" target=\"_blank\" rel=\"noopener\">semiconductor<\/a> technology, the <a href=\"https:\/\/en.wikipedia.org\/wiki\/IM_Flash_Technologies\" target=\"_blank\" rel=\"noopener\">Intel Micron Flash Technologies<\/a> or IMFT emerged as a key player. IMFT, a collaboration between Intel and Micron, started with their 50nm NAND flash design and then introduced 34nm NAND flash. They made significant advancements in the NAND flash semiconductor technology and introduced their most advanced design, the IMFT\u2019s 25nm NAND flash. This blog explores the IMFT&#8217;s 25nm NAND flash and the role of double patterning in achieving this technological innovation.<\/p>\n<h2><strong>IMFT&#8217;s 25nm NAND Flash<\/strong><strong>: An overview<\/strong><\/h2>\n<p>IMFT&#8217;s introduction of the 25nm NAND <a href=\"https:\/\/partstack.com\/c\/memory-ics\/flash-memory\" target=\"_blank\" rel=\"noopener\">flash memory<\/a> was a great achievement in semiconductor technology. When the IMFT\u2019s NAND flash was introduced, Tom Rampone (Vice President of Intel) said that we could store 2000 songs, 7000 photos, and about 8 hours of standard definition video in one IMFT\u2019s NAND flash chip, and with two IMFT\u2019s NAND flash chips, we can even load the complete Windows 7 operating system. He also said that the IMFT\u2019s 25nm NAND flash has twice the storage capacity, and the density of the IMFT\u2019s 34nm NAND flash is roughly the same size. The storage capacity of one IMFT\u2019s 25nm NAND flash device is about 8 gigabytes and its size is 167 mm<sup>2, <\/sup>which is smaller than the size of CD hole.<\/p>\n<p>However, the IMFT\u2019s NAND flash can store 10 times more data than a standard CD, which usually has a capacity of 700 megabytes. So, at the time of its release, it was the smallest NAND flash node, which enabled more memory to be stacked and stored in a smaller physical space. This advancement not only improved the storage capacity but also reduced production costs, which ultimately benefitted both manufacturers and consumers.<\/p>\n<h2><strong>Understanding NAND Flash Memory<\/strong><\/h2>\n<p>Flash memory is a non-volatile memory that can be used as a memory storage medium within a computer. The flash memory can be electronically erased and reprogrammed, just like the <a href=\"https:\/\/partstack.com\/c\/memory-ics\/eeprom\" target=\"_blank\" rel=\"noopener\">EEPROM<\/a>. The flash memory works by storing the data in memory cells. These memory cells use floating gate transistors to store and retrieve data. There are two types of flash memory: NAND flash memory and NOR flash memory. So, the NAND flash is a type of non-volatile storage technology which retains data without any power.<\/p>\n<p>The NAND flash memory is widely used in commercial electronic devices such as smartphones, solid state drives (SSDs), <a href=\"https:\/\/partstack.com\/c\/memory\/memory-cards\" target=\"_blank\" rel=\"noopener\">memory cards<\/a>, and USB drives, etc. The NAND flash memory is well-known for its high pattern density, low cost per bit, and excellent read\/write performance. These characteristics make it a good choice for such applications that require large amounts of data to be stored in a compact manner and need to be accessed quickly.<\/p>\n<h2><strong>Double patterning<\/strong><strong> and its role in IMFT\u2019s NAND flash<\/strong><\/h2>\n<h3>The transition from 34nm to 25nm Process Node<\/h3>\n<p>One of the core techniques that enabled the transition from IMFT\u2019s 34 nm NAND flash process node to IMFT\u2019s 25nm NAND flash process node was double patterning. Double patterning is a photolithographic technique used to overcome the resolution limits of conventional photolithography. Before moving on to double patterning, it is important to understand photolithography.<\/p>\n<h3>Understanding Photolithography<\/h3>\n<p>Photolithography is a technique used for etching the patterns on silicon wafers through light radiations. Initially, a photo-resistive material is applied to the silicon wafer surface. This material can be either in liquid or in solid state. The silicon wafer then rotates for a specific time period and in an apparatus with a certain rpm.<\/p>\n<p>The number of rpm decides whether the layer of photo-resistive material is thin or thick. For example, if the silicon wafer is rotated with low rpm, the layer of photo resistive will be thick and if the silicon wafer is rotated with high rpm, the layer of photo resistive will be thin. Afterward, the silicon wafer is exposed to light, and a mask is placed over it, and it is then placed in the developer solution, which removes the excessive material. This way, the pattern of the mask is etched on the silicon wafer using photolithography.<\/p>\n<h3>The Double Patterning Technique<\/h3>\n<p>The double patterning involves splitting up the patterning process into two steps to achieve finer feature sizes. In semiconductor fabrication, when feature sizes shrink, the limitations of photolithography are increased. Hence, traditional photolithography cannot be used for the effective inclusion of the extremely small features required for IMFT\u2019s 25nm NAND flash. This is where the double patterning technique comes into play.<\/p>\n<h3>Approaches to Double Patterning<\/h3>\n<p>There are several approaches used for implementing double patterning in IMFT\u2019s NAND flash, which include:<\/p>\n<ol>\n<li><b>Litho-etch-litho-etch: <\/b>The LELE technique is considered the most simple and straightforward double patterning. The first step within the LELE double patterning technique is the lithography, followed by the second step, which is an etching of the mask. This process is then repeated to achieve the final pattern with double pattern density on a silicon wafer.<\/li>\n<li><strong>Litho-freeze-litho-etch:<\/strong> The LFLE double patterning uses two lithography, one etching and one freezing process. After first lithography process, the developed layer is chemically frozen, and it is then covered with second layer of photo resistive material. Then, a second pattern is imposed via lithography followed by the last step which is etching. This imposes the final pattern on the silicon wafer with double pattern density.<\/li>\n<li><b>Self-Aligned Double Patterning:<\/b> In the SADP double patterning technique, an initial photo resistive pattern is created that helps in defining the spacings for a final pattern, which will be etched on a silicon wafer. After this step, a masking material is deposited and etched, which causes some sidewall spacers to form around the initial pattern. The initial photoresist material is then removed, leaving behind the sidewall spacers, and the final pattern with double pattern density is etched on the silicon wafer using these sidewall spacers.<\/li>\n<\/ol>\n<h3>Benefits and Challenges of Double Patterning<\/h3>\n<p>The double patterning enabled smaller feature sizes for both interconnects and the memory cells, which eventually led to shorter distances for electrical signals to travel within the IMFT\u2019s 25nm NAND flash. This increases storage capacity, speed, and overall memory performance.\u00a0 Along with advantages, IMFT\u2019s NAND flash faced a few challenges while using double patterning. The double patterning increased the complexity of the manufacturing process. It required precise alignment and some additional steps, which led to longer production times and high initial costs. The increased complexity also affected the yield rates because a slight misalignment or any minor error during the double patterning process could result in a whole batch full of defective NAND flash chips. Consequently, efficiency and production would decrease.<\/p>\n<h2><strong>Conclusion<\/strong><\/h2>\n<p>With each passing day, more advanced lithographic and patterning techniques are being introduced into semiconductor technology. These innovations aim to increase storage capacity and pattern density and improve the overall performance of flash memory. Hence, the IMFT\u2019s NAND flash can be referred to as the pioneer invention that opened the realm of next-generation multi-patterning and advanced lithographic techniques, which eventually pushed the boundaries of semiconductor technology.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>In the evolving era of NAND flash semiconductor technology, the Intel Micron Flash Technologies or IMFT emerged as a key player. IMFT, a collaboration between Intel and Micron, started with their 50nm NAND flash design and then introduced 34nm NAND flash. They made significant advancements in the NAND flash semiconductor technology and introduced their most [&hellip;]<\/p>\n","protected":false},"author":18,"featured_media":2894,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[2],"tags":[],"class_list":["post-2892","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-semiconductors"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v24.0 (Yoast SEO v28.2) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>IMFT&#039;s 25nm NAND Flash: Double Patterning Breakthrough<\/title>\n<meta name=\"description\" content=\"Discover IMFT&#039;s 25nm NAND flash memory, the impact of double patterning on semiconductor technology, &amp; advancements in storage capacity.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, 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sector research university in Pakistan. Razzaq holds a Bachelor\u2019s degree with distinction in electronic engineering from Ghulam Ishaq Khan Institute of Engineering Sciences and Technology (GIKI) and a Master\u2019s degree in Sustainable Transportation and Electrical Power Systems from the University of Nottingham, Universidad de Oviedo, and La Sapienza University of Rome. Razzaq\u2019s diverse work experiences in academia and industry continue to inform her prolific technical writing journey in the areas of electrical engineering, storage mechanisms, power electronics, electric vehicles, energy, and related topics.","sameAs":["http:\/\/partstack.com","https:\/\/www.linkedin.com\/in\/fatimarazzaq\/"],"url":"https:\/\/partstack.com\/blog\/author\/fatimarazzaq\/"}]}},"_links":{"self":[{"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/posts\/2892","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/users\/18"}],"replies":[{"embeddable":true,"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/comments?post=2892"}],"version-history":[{"count":2,"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/posts\/2892\/revisions"}],"predecessor-version":[{"id":2895,"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/posts\/2892\/revisions\/2895"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/media\/2894"}],"wp:attachment":[{"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/media?parent=2892"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/categories?post=2892"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/partstack.com\/blog\/wp-json\/wp\/v2\/tags?post=2892"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}